Instrumentation in nanotechnology
- 최초 등록일
- 2010.06.15
- 최종 저작일
- 2010.06
- 13페이지/
MS 파워포인트
- 가격 2,000원
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소개글
Electron microscope(EM)
• SEM (scanning electron microscope)
• FESEM (field emission scanning electron microscope)
• TEM (transmission electron microscope)
• HRTEM (high resolution transmission electron microscope)
Scanning probe microscope(SPM)
• STM(scanning tunneling microscope)
• AFM(atomic force microscope)
목차
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본문내용
Electron microscope(EM)
• SEM (scanning electron microscope)
• FESEM (field emission scanning electron microscope)
• TEM (transmission electron microscope)
• HRTEM (high resolution transmission electron microscope)
Scanning probe microscope(SPM)
• STM(scanning tunneling microscope)
• AFM(atomic force microscope)
The scanning electron microscope (SEM) is a type of electron microscope that images the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern.
The electrons interact with the atoms that make up the sample producing signals that contain information about the sample`s surface topography, composition and other properties such as electrical conductivity.
참고 자료
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