탄소강 파단면 검사

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Abstract
1. Introduction
2. Experimental
3. Expected Result
References

본문내용

2.1.7 Scanning Electron Microscope(SEM)

The SEM has a large depth of field (i.e., the amount of the sample that can be in sharp focus at one time), which can be up to four hundred times greater than that of a light microscope.[5] Much of the analysis of SEM samples is done within the magnification range of the light microscope.[4] The total information content of the image from an SEM, can be much greater because of its great depth of field. The SEM also has higher resolution than that of a light microscope; thus, samples can be examined at a higher magnification than is possible with a light microscope.[4] The instrument has an extremely wide range of magnification, usually between about 10 and 100,000.[5]

2.2 Material and Equipment

Carbon Steel(2EA), Sand paper, Charpy impact tester, SEM instrument(Hitachi S-9400 model), Vernier calipers

참고 자료

[1] George E, Dieter, 1988, “Mechanical Metalurgy”, pp.241~272
[2] Chang-ju Kim, 1993, “Metal-machine material test”, pp.197~227
[3] Annual Book of ASTM standards 2005/ 03.01: Metals-Mechanical Testing, pp.158~183, 834~839
[4] V. K. Zworykin, G. A. Morton, E. G. Ramberg, J.Hillier, A. W. Vance, 1957, “Electron Optics and The Electron Microscope”, Fourth edition, pp.98
[5] Stanley L. flegler, John W. Heckman, Jr, Karen L. Klomparens, 1993, “Scanning and Transmission Electron Microscopy An Introduction”, pp.65~69